Question 10.9: In the production of silicon wafers, 30 lots of size 500 are...
In the production of silicon wafers, 30 lots of size 500 are sampled, and the proportion of defective wafers is calculated for each sample. Table 10.2 presents the results. Compute the center line and 3σ control limits for the p chart. Plot the chart. Does the process appear to be in control?
TABLE 10.2 Number and proportion defective, for Example 10.9 | |||||
Sample | Number Defective |
Proportion Defective (\hat{p}) | Sample | Number Defective |
Proportion Defective (\hat{p}) |
1 | 17 | 0.034 | 16 | 26 | 0.052 |
2 | 26 | 0.052 | 17 | 19 | 0.038 |
3 | 31 | 0.062 | 18 | 31 | 0.062 |
4 | 25 | 0.050 | 19 | 27 | 0.054 |
5 | 26 | 0.052 | 20 | 24 | 0.048 |
6 | 29 | 0.058 | 21 | 22 | 0.044 |
7 | 36 | 0.072 | 22 | 24 | 0.048 |
8 | 26 | 0.052 | 23 | 30 | 0.060 |
9 | 25 | 0.050 | 24 | 25 | 0.050 |
10 | 21 | 0.042 | 25 | 26 | 0.052 |
11 | 18 | 0.036 | 26 | 28 | 0.056 |
12 | 33 | 0.066 | 27 | 22 | 0.044 |
13 | 29 | 0.058 | 28 | 31 | 0.062 |
14 | 17 | 0.034 | 29 | 18 | 0.036 |
15 | 28 | 0.056 | 30 | 23 | 0.046 |
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